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Works cited by this work

15 works

Work: Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

  1. Surface ionization of organic compounds and its applications

    У. Х. Расулев, É. Ya. Zandberg

    Article198831 citations
    ABI

  2. Surface-ionization methods and devices of indication and identification of nitrogen-containing base molecules

    У. Х. Расулев, У. Хасанов, V.V Palitcin

    ArticleAnalytical Chemistry and ChromatographyJournal of Chromatography A200020 citations
    ABI

  3. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 citations
    ABI

  4. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics Letters200312 citations
    ABI

  5. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 citations
    ABI

  6. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisApplied Surface Science200411 citations
    ABI

  7. Emission of quasi-thermal ions from a solid bombarded by cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics20097 citations
    ABI

  8. Cluster impacts at keV and MeV energies: Secondary emission phenomena

    Y. Le Beyec

    Article19987 citations
    ABI

  9. Generation of large indium clusters by sputtering

    Christian Staudt, A. Wucher

    Article20026 citations
    ABI

  10. Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

    Alain Brunelle, S. Della‐Negra, J. Depauw +5

    Article20015 citations
    ABI

  11. Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

    D. Stapel, A. Benninghoven

    Article20015 citations
    ABI

  12. Sputtering of indium using<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi mathvariant="normal">Au</mml:mi><mml:mi>m</mml:mi></mml:msub></mml:math>projectiles: Transition from linear cascade to spike regime

    A.V. Samartsev, A. Duvenbeck, A. Wucher

    Article20054 citations
    ABI

  13. Sputtering of indium using polyatomic projectiles

    A.V. Samartsev, A. Wucher

    Article20042 citations
    ABI

  14. Untitled

    Other1 citations
    ABI

  15. Untitled

    Other1 citations
    ABI