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12 works

Work: Thermal spikes observed during the tantalum sputtering by gold cluster ions

  1. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 citations
    ABI

  2. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisApplied Surface Science200411 citations
    ABI

  3. Indium sputtering upon bombardment with cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20122 citations
    ABI

  4. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 citations
    ABI

  5. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 citations
    ABI

  6. Sputtering of GaAs target under Bi+ cluster ions bombardment

    Sh.Dj. Akhunov, G.P. Kakhramonova, Sh.M. Axmedov +2

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20221 citations
    ABI

  7. Ion-photon emission under bombardment of Ta target with cluster and multiply charged Bi ions

    Sh.Dj. Akhunov, G.P. Kakhramonova, Dilshadbek T. Usmanov

    ArticleIon-surface interactions and analysisVacuum20231 citations
    ABI

  8. A surface‐ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20121 citations
    ABI

  9. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 citations
    ABI

  10. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics20130 citations
    ABI

  11. SIMS of silicon bombarded with Sb+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 citations
    ABI

  12. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

    Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20240 citations
    ABI