Skip to main content
AkademIndex

Products

For developers

AkademBaseOpen API for the ecosystem
← Back to work

Works citing this work

9 works

Work: High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 citations
    ABI

  2. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 citations
    ABI

  3. Indium sputtering upon bombardment with cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20122 citations
    ABI

  4. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 citations
    ABI

  5. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 citations
    ABI

  6. Sputtering of GaAs target under Bi+ cluster ions bombardment

    Sh.Dj. Akhunov, G.P. Kakhramonova, Sh.M. Axmedov +2

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20221 citations
    ABI

  7. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 citations
    ABI

  8. SIMS of silicon bombarded with Sb+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 citations
    ABI

  9. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

    Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20240 citations
    ABI