А. И. Иванов
Работ: 2
Ioffe Physicotechnical Institute RAS
Oxygen Gettering on Buried Layers at Post-Implantation Annealing of Hydrogen Implanted Czochralski Silicon
R. Job, W. R. Fahrner, A. Ulyashin +3
СтатьяSilicon and Solar Cell TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena1997Цитирований: 0ABI