В. В. Ратников
Работ: 3
Russian Academy of Sciences
X-Ray Diffractometry and Topography of CdHgTe Bulk Crystals and CdHgTe-CdTe Epitaxial Structures
В. В. Ратников, T. S. Argunova, K.E. Mironov +1
СтатьяAdvanced Semiconductor Detectors and MaterialsDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena1991Цитирований: 0ABI