E. V. Rakova

Работ: 1

Shubnikov Institute of Crystallography of Federal Scientific Research Centre “Crystallography and Photonics,”, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119333, Russia

1. Electron microscopy characterization of higher manganese silicide film structure on silicon

   Andrey Orekhov, T. S. Kamilov, Anton S. Orekhov +3

   СтатьяSemiconductor materials and interfacesNanotechnologies in Russia2016Цитирований: 7

   ABIABI:AkademIndex/openalex/2026.other.079735