Работы, цитирующие эту работу

Работ: 3

Работа: Composition of uncontrolled impurities and their chemical states and depth profiles at the Al-Si interface

1. Study of the Composition of Uncontrolled Impurities and the Profiles of Their Distribution at the Ni–CdS Interface

   A. A. Abduvayitov, Kh. Kh. Boltaev, G. A. Rozikov

   СтатьяChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2022Цитирований: 0

   ABIABI:AkademIndex/openalex/2022.article.008003

2. The influence of implantation of Mg+ ions and subsequent annealing on the composition, electronic structures, emission and optical properties of CdF2

   A. A. Abduvayitov, Gunel Imanova, Д. А. Ташмухамедова +2

   СтатьяElectron and X-Ray Spectroscopy TechniquesScientific Herald of Uzhhorod University Series Physics2023Цитирований: 0

   ABIABI:AkademIndex/openalex/2023.article.012489

3. Study of regularities of formation of thin three-component CdMgTe films on CdTe(111) surface upon implantation of Mg ions and subsequent annealing

   Д. А. Ташмухамедова, A. A. Abduvayitov, X. X. Boltaev +2

   СтатьяAdvanced Semiconductor Detectors and MaterialsAIP conference proceedings2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.007142