Influence of deformation and light on the diffusion capacity and differential resistance of the p-n junction of a strong electromagnetic field
G. GulyamovNamangan engineering – construction institute, Islam Karimov avenue, 12, Namangan, UzbekistanM. G. DadamirzayevNamangan engineering – construction institute, Islam Karimov avenue, 12, Namangan, UzbekistanM. O. QosimovaNamangan engineering – construction institute, Islam Karimov avenue, 12, Namangan, UzbekistanS. R. BoydedayevNamangan engineering – construction institute, Islam Karimov avenue, 12, Namangan, Uzbekistan
ABI
Аннотация
The work studied the effect of deformation and light on the differential resistance of the p-n-junction and the diffusion capacity in a strong electromagnetic field of ultrahigh frequency (microwave). It is shown that the differential resistance of the p-n-junction decreases under the action of a strong electromagnetic field and deformation, and light does not affect the differential resistance p-n-junction. And also there was an increase in diffusion capacity p-n-junction under the influence of a strong electromagnetic field and deformation.
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