Работы, цитирующие эту работу

Работ: 2

Работа: Characterization of Cu and Ni Precipitates in n– and p-type Czochralski-grown Silicon by Photoluminescence

1. The Effect of Thermal Annealing on the Electrophysical Properties of Samples n-Si<Ni,Сu>

   N. A. Turgunov, Elmurod Kh. Berkinov, R.M. Turmanova

   СтатьяSilicon and Solar Cell TechnologiesEast European Journal of Physics2023Цитирований: 8

   ABIABI:AkademIndex/openalex/2026.other.279528

2. INFLUENCE OF IMPURITY NI AND CU ATOMS ON THE ELECTROPHYSICAL PROPERTIES OF SI

   N. A. Turgunov, E.Kh. Berkinov, R.M. Turmanova

   СтатьяSilicon and Solar Cell TechnologiesAmerican Journal Of Applied Science And Technology2023Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.585531