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Effect of the Disordering of Thin Surface Layers on the Electronic and Optical Properties of Si(111)

Б. Е. УмирзаковTashkent State Technical University, 100095, Tashkent, UzbekistanД. А. ТашмухамедоваTashkent State Technical University, 100095, Tashkent, UzbekistanA. K. TashatovKarshi State University, 180003, Karshi, UzbekistanN. M. MustafoevaKarshi State University, 180003, Karshi, UzbekistanD. M. MuradkabilovTashkent State Technical University, 100095, Tashkent, Uzbekistan
Semiconductorsjournal2020en
ABI

Аннотация

The degree of disordering and the thickness d of disordered layers and their effect on the band gap Eg of single-crystal Si(111) under Ar+-ion bombardment are studied for the first time. It is shown that the d value at ion energies of E0 = 1 and 2 keV is ~(100–120) and ~(150–160) Å, respectively. In this case, the density of states of electrons in the Si(111) valence band significantly changes, the light transmittance decreases to K = 55–60%, and the Eg value increases by ~10%. Under Ni+-ion bombardment, surface disordering is accompanied by a sharp change in the composition of the surface layers and, as a result, the K value decreases to 5–10%. After heating at T = 900 K, nanocrystals (at doses of D ≤ 1015 cm–2) and NiSi2 nanofilms (at D = 6 × 1016 cm–2) are formed.

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