Работы, цитирующие эту работу

Работ: 7

Работа: Cluster impacts at keV and MeV energies: Secondary emission phenomena

1. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

   С. Н. Морозов, У. Х. Расулев

   СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2006Цитирований: 11

   ABIABI:AkademIndex/openalex/2026.other.413689

2. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions

   Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov

   СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2021Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.415083

3. Model for large cluster emission in ion sputtering of metals applied to atomic and polyatomic ion bombardments

   S.F. Belykh, V. I. Matveev, I. V. Veryovkin +2

   СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms1999Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.485698

4. Cluster projectile ions used for the SIMS analysis of silicon

   Sh.Dj. Akhunov, С. Н. Морозов

   СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2013Цитирований: 1

   ABIABI:AkademIndex/openalex/2013.article.000207

5. A surface‐ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions

   С. Н. Морозов, У. Х. Расулев

   СтатьяIon-surface interactions and analysisSurface and Interface Analysis2012Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.415073

6. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

   С. Н. Морозов, У. Х. Расулев

   СтатьяIon-surface interactions and analysisTechnical Physics2013Цитирований: 0

   ABIABI:AkademIndex/openalex/2013.article.000300

7. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

   Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

   СтатьяIon-surface interactions and analysisSurface and Interface Analysis2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.article.008231