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Ушбу иш иқтибос қилган ишлар

15 та иш

Иш: Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 иқтибос
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisTechnical Physics Letters200312 иқтибос
    ABI

  3. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 иқтибос
    ABI

  4. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisApplied Surface Science200411 иқтибос
    ABI

  5. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

    МақолаIon-surface interactions and analysisVacuum20009 иқтибос
    ABI

  6. Non-linear effects in Ta sputtering by Au− ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20036 иқтибос
    ABI

  7. Generation of large indium clusters by sputtering

    Christian Staudt, A. Wucher

    Мақола20026 иқтибос
    ABI

  8. The Magic of Cluster SIMS

    Nicholas Winograd

    Мақола20055 иқтибос
    ABI

  9. ToF-SIMS : surface analysis by mass spectrometry

    John C. Vickerman, D. Briggs

    Китоб20015 иқтибос
    ABI

  10. Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

    D. Stapel, A. Benninghoven

    Мақола20015 иқтибос
    ABI

  11. Cluster impacts on solids

    D. Jacquet, Y. Le Beyec

    Мақола20024 иқтибос
    ABI

  12. A C<sub>60</sub> Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

    Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer +3

    Мақола20033 иқтибос
    ABI

  13. Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry

    Christine M. Mahoney, Sonya Roberson, Greg Gillen

    Мақола20043 иқтибос
    ABI

  14. Cluster primary ion bombardment of organic materials

    Felix Kollmer

    Мақола20042 иқтибос
    ABI

  15. Cluster primary ion bombardment of organic materials

    Felix Kollmer

    Мақола20042 иқтибос
    ABI