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Ушбу иш иқтибос қилган ишлар

14 та иш

Иш: Cluster projectile ions used for the SIMS analysis of silicon

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 иқтибос
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisTechnical Physics Letters200312 иқтибос
    ABI

  3. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 иқтибос
    ABI

  4. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

    МақолаIon-surface interactions and analysisVacuum20009 иқтибос
    ABI

  5. Comparative study of kinetic energy spectra and mass distributions of Ta+ ions sputtered from tantalum by atomic and molecular ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +1

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19988 иқтибос
    ABI

  6. Cluster impacts at keV and MeV energies: Secondary emission phenomena

    Y. Le Beyec

    Мақола19987 иқтибос
    ABI

  7. Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

    D. Stapel, O. Brox, A. Benninghoven

    Мақола19995 иқтибос
    ABI

  8. Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

    Alain Brunelle, S. Della‐Negra, J. Depauw +5

    Мақола20015 иқтибос
    ABI

  9. Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

    D. Stapel, A. Benninghoven

    Мақола20015 иқтибос
    ABI

  10. Sputtering of large size clusters from solids bombarded by high energy cluster ions and fullerenes

    K. Baudin, Alain Brunelle, S. Della‐Negra +6

    Мақола19964 иқтибос
    ABI

  11. Surface Mass Spectrometry at the Submicrometer Scale

    С. В. Верхотуров, E. A. Schweikert, Nabil Rizkalla

    Мақола20022 иқтибос
    ABI

  12. Teoriya raspyleniya

    G. Falcone

    Мақола19922 иқтибос
    ABI

  13. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI

  14. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI