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Иш: Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions
Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions
Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев
МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 иқтибосABIComparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles
МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 иқтибосABIVery large gold and silver sputtering yields induced by keV to MeV energy<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Au</mml:mi></mml:mrow><mml:mrow><mml:mi>n</mml:mi></mml:mrow></mml:msub></mml:mrow></mml:math>clusters<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mo>(</mml:mo><mml:mi>n</mml:mi><mml:mo>=</mml:mo><mml:mn>1</mml:mn><mml:mn/><mml:mo>–</mml:mo><mml:mn>1</mml:mn><mml:mn>3</mml:mn><mml:mo>)</mml:mo></mml:math>
S. Bouneau, Alain Brunelle, S. Della‐Negra +7
Мақола20027 иқтибосABISputtering source of cluster ions and surface-ionization source of polyatomic ions of organic compounds
У. Х. Расулев, С. Н. Морозов, У. Хасанов +1
МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20065 иқтибосABIMolecular secondary ion formation under cluster bombardment: A fundamental review
Шарҳ мақола20063 иқтибосABIOn the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions
Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov
МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20213 иқтибосABIMetal-assisted SIMS and cluster ion bombardment for ion yield enhancement
Andreas Heile, D. Lipinsky, Nimer Wehbe +8
Мақола20082 иқтибосABIRecent Progress in Cluster Beam Technique
Jiro Matsuo, Makiko Fujii, Toshio Seki +1
Мақола20162 иқтибосABINonlinear effects in low-energy ion sputtering of solids
Yuriy Kudriavtsev, R. Asomoza, A. G. Hernández +3
Мақола20202 иқтибосABI