Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Metal Silicides in CMOS Technology: Past, Present, and Future Trends

1. Peculiarities of BaTiO₃ in electronic and X-Ray analysis

   M.T. Normuradov, Ш. Т. Хожиев, L.B. Akhmedova +3

   МақолаSolid-state spectroscopy and crystallographyE3S Web of Conferences20236 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.264916

2. Structure of thermoelectric films of higher manganese silicide on silicon according to electron microscopy data

   Andrey Orekhov, T. S. Kamilov, B.V. Ibragimova +2

   МақолаSemiconductor materials and interfacesSemiconductors20175 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.199258