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Иш: Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 иқтибос
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisTechnical Physics Letters200312 иқтибос
    ABI

  3. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisApplied Surface Science200411 иқтибос
    ABI

  4. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

    МақолаIon-surface interactions and analysisVacuum20009 иқтибос
    ABI

  5. Nonlinear effects in cluster emission from solids induced by molecular ion impact

    S.F. Belykh, I.S. Bitensky, D. Mullajanov +1

    Мақола19979 иқтибос
    ABI

  6. Cluster impacts at keV and MeV energies: Secondary emission phenomena

    Y. Le Beyec

    Мақола19987 иқтибос
    ABI

  7. Very large gold and silver sputtering yields induced by keV to MeV energy<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Au</mml:mi></mml:mrow><mml:mrow><mml:mi>n</mml:mi></mml:mrow></mml:msub></mml:mrow></mml:math>clusters<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mo>(</mml:mo><mml:mi>n</mml:mi><mml:mo>=</mml:mo><mml:mn>1</mml:mn><mml:mn/><mml:mo>–</mml:mo><mml:mn>1</mml:mn><mml:mn>3</mml:mn><mml:mo>)</mml:mo></mml:math>

    S. Bouneau, Alain Brunelle, S. Della‐Negra +7

    Мақола20027 иқтибос
    ABI

  8. Non-linear effects in Ta sputtering by Au− ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20036 иқтибос
    ABI

  9. Relative yields, mass distributions and energy spectra of cluster ions sputtered from niobium under keV atomic and polyatomic gold ion bombardment

    S.F. Belykh, B Habets, У. Х. Расулев +3

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20005 иқтибос
    ABI

  10. ToF-SIMS : surface analysis by mass spectrometry

    John C. Vickerman, D. Briggs

    Китоб20015 иқтибос
    ABI

  11. Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

    D. Stapel, O. Brox, A. Benninghoven

    Мақола19995 иқтибос
    ABI

  12. Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

    Alain Brunelle, S. Della‐Negra, J. Depauw +5

    Мақола20015 иқтибос
    ABI

  13. Nonadditive sputtering of silicon by keV energy molecular projectiles of heavy and light elements

    S.F. Belykh, A.P. Kovarsky, Vladimir Palitsin +2

    Мақола20013 иқтибос
    ABI

  14. A C<sub>60</sub> Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

    Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer +3

    Мақола20033 иқтибос
    ABI

  15. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

    Greg Gillen, Sonya Roberson

    Мақола19982 иқтибос
    ABI