Ушбу ишга иқтибос қилган ишлар

4 та иш

Иш: Analysis of structural defects in the CdSe x S1 – x nanocrystals

1. Effect of the Disordering of Thin Surface Layers on the Electronic and Optical Properties of Si(111)

   Б. Е. Умирзаков, Д. А. Ташмухамедова, A. K. Tashatov +2

   МақолаSemiconductor materials and interfacesSemiconductors20204 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.402217

2. Effect of Ion Bombardment on the Density of States of Valence Electrons in CdS Films

   Б. Е. Умирзаков, Д. А. Ташмухамедова, Eshboy Rabbimov +2

   МақолаChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20193 иқтибос

   ABIABI:AkademIndex/openalex/2019.article.000688

3. Distribution of Molybdenum Atoms over Depth of the Surface Layer of a Niobium Single Crystal Produced by Ion Bombardment

   Y. S. Ergashov, S. B. Donaev

   МақолаIon-surface interactions and analysisJournal of Nano- and Electronic Physics20221 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.095304

4. Study of the Composition of Uncontrolled Impurities and the Profiles of Their Distribution at the Ni–CdS Interface

   A. A. Abduvayitov, Kh. Kh. Boltaev, G. A. Rozikov

   МақолаChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.article.008003