Ушбу ишга иқтибос қилган ишлар

4 та иш

Иш: Impact of Off-State Stress and Negative Bias Temperature Instability on Degradation of Nanoscale pMOSFET

1. Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection

   A. É. Atamuratov, Ahmed Yusupov, Zamira Atamuratova +2

   МақолаSemiconductor materials and devicesApplied Sciences20203 иқтибос

   ABIABI:AkademIndex/openalex/2020.article.000900

2. Capacitance Method for Identifying Degradation due to Electrical Stress in MOSFETs

   Zamira Atamuratova, Ahmed Yusupov, Jean Chamberlain Chedjou +1

   МақолаSemiconductor materials and devicese-Journal of Surface Science and Nanotechnology20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.article.006400

3. Capacitance-Voltage Method for Detecting the local oxide trapped charge in SOI FinFET

   A.E. Abdikarimov, Mirzabahrom Foziljonov, И. Н. Каримов

   МақолаSemiconductor materials and devices20220 иқтибос

   ABIABI:AkademIndex/openalex/2022.article.011220

4. Impacts of Local Oxide Trapped Charge on Electrical and Capacitance Characteristics of SOI FinFet

   A. É. Atamuratov, И. Н. Каримов, Mirzabahrom Foziljonov +3

   МақолаSemiconductor materials and devicesEast European Journal of Physics20250 иқтибос

   ABIABI:AkademIndex/openalex/2025.article.009018