E. V. Rakova

2 ta ish

Russian Academy of Sciences

1. Electron microscopy characterization of higher manganese silicide film structure on silicon

   Andrey Orekhov, T. S. Kamilov, Anton S. Orekhov +3

   MaqolaSemiconductor materials and interfacesNanotechnologies in Russia20167 iqtibos

   ABIABI:AkademIndex/2026.other.079735

2. The dependence of the microstructure and thermoelectric properties of germanium-doped higher manganese silicide crystals

   Andrey Orekhov, V. V. Klechkovskaya, E. V. Rakova +4

   Maqola20172 iqtibos

   ABIABI:AkademIndex/2026.other.410933