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Ushbu ish iqtibos qilgan ishlar

14 ta ish

Ish: On the unimolecular decay and mechanism of formation of Si+ n cluster ions

  1. Sputtering by Particle Bombardment III

    R. Behrisch, K. Wittmaack, Wittmaack, Klaus +1

    Kitob199118 iqtibos
    ABI

  2. Ion microprobe for studying cluster ion decay reactions

    A. D. Bekkerman, Н. Х. Джемилев, V. M. Rotstein

    Maqola199016 iqtibos
    ABI

  3. Unimolecular reactions

    P. G. Ashmore, Peter Robinson

    Bob197515 iqtibos
    ABI

  4. Fragmentation of sputtered Si n O+ m clusters: Release kinetic and dissociation energies

    Н. Х. Джемилев, С. Ф. Коваленко, L.F. Lifanova +2

    MaqolaIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics200811 iqtibos
    ABI

  5. Shock wave mechanism for cluster emission and organic molecule desorption under heavy ion bombardment

    I.S. Bitensky, E.S. Parilis

    Maqola19878 iqtibos
    ABI

  6. Mechanism for the formation of molecular clusters under ion sputtering

    Н. Х. Джемилев

    MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20127 iqtibos
    ABI

  7. On the energy distribution of sputtered dimers

    G. P. Können, A. Tip, A.E. De Vries

    Maqola19745 iqtibos
    ABI

  8. Decay rate constants of sputtered vanadium oxide clusters

    С. Е. Максимов, Н. Х. Джемилев, С. Ф. Коваленко +2

    MaqolaTransition Metal Oxide NanomaterialsBulletin of the Russian Academy of Sciences Physics20144 iqtibos
    ABI

  9. Energy spectrum of a 2D Dirac electron in the presence of a constant magnetic field

    Vı́ctor M. Villalba, A. Rincon Maggiolo

    Maqola20014 iqtibos
    ABI

  10. Fragmentation processes of vanadium and niobium oxide clusters sputtered by ion bombardment

    Н. Х. Джемилев, С. Ф. Коваленко, С. Е. Максимов +2

    MaqolaCatalytic Processes in Materials ScienceJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20143 iqtibos
    ABI

  11. Atomic and cluster ion emission from silicon in secondary-ion mass spectrometry

    C.-E. Richter, Michael Trapp

    Maqola19813 iqtibos
    ABI

  12. Sarlavhasiz

    Boshqa1 iqtibos
    ABI

  13. Sarlavhasiz

    Boshqa1 iqtibos
    ABI

  14. Sarlavhasiz

    Boshqa1 iqtibos
    ABI