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15 ta ish

Ish: The Influence of Fin Shape on the Amplitude of Random Telegraph Noise in the Subthreshold Regime of a Junctionless FinFET

  1. Quantum corrections in the simulation of decanano MOSFETs

    Asen Asenov, A. R. Brown, J.R. Watling

    Maqola20034 iqtibos
    ABI
  2. RTN distribution comparison for bulk, FDSOI and FinFETs devices

    Louis Gerrer, Salvatore Amoroso, Razaidi Hussin +1

    Maqola20143 iqtibos
    ABI
  3. Ultralow-Power Design in Near-Threshold Region

    Dejan Marković, C.C. Wang, Louis P. Alarcón +2

    Maqola20102 iqtibos
    ABI
  4. Sarlavhasiz

    Boshqa2 iqtibos
    ABI