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Ish: Gate Oxide And Back Oxide Materials Combined Influence On Self-Heating And Dibl Effects In 2d Mos<sub>2</sub> Based Mosfet
Single-layer MoS2 transistors
Branimir Radisavljevic, Aleksandra Rađenović, Jacopo Brivio +2
Maqola20118 iqtibosABIThermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films
Matthew A. Panzer, Michael Shandalov, Jeremy Rowlette +4
Maqola20094 iqtibosABIMOSFET scaling: Impact of two-dimensional channel materials
R. Granzner, Zhansong Geng, W. Kinberger +1
Maqola20164 iqtibosABIChannel Length Scaling of MoS<sub>2</sub> MOSFETs
Han Liu, Adam T. Neal, Peide D. Ye
Maqola20123 iqtibosABIAdvances in MoS2-Based Field Effect Transistors (FETs)
Xin Tong, Eric Ashalley, Feng Lin +2
Sharh maqola20152 iqtibosABIThe contribution of gate and drain voltages to temperature distribution along the channel in 2D MoS<sub>2</sub> based MOSFET
A. É. Atamuratov, X. Sh. Saparov, T.A. Atamuratov +2
MaqolaGraphene research and applications2021 International Conference on Information Science and Communications Technologies (ICISCT)20212 iqtibosABI