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Ish: Study of the Formation of Low-Dimensional Defect States in Single-Crystal Silicon with the Participation of Oxygen
Computer Simulation of Scattering Xe<sup>+</sup> Ions from InP(001)❬110❭ Surface at Grazing Incidence
Karimov Mukhtorjon Karimberganovich, Matchоnov Khusniddin Jamoladdinovich, Otaboeva Kamola Uchkun qizi +1
MaqolaIon-surface interactions and analysise-Journal of Surface Science and Nanotechnology201911 iqtibosABI