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30 ta ish

Ish: Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

  1. Checkability of the digital components in safety-critical systems: Problems and solutions

    Oleksandr Drozd, Vyacheslav Kharchenko, Svetlana Antoshchuk +2

    Maqola201112 iqtibos
    ABI

  2. Self-Dual Complement Method up to Constant-Weight Codes for Arrangement of Combinational Logical Circuits Concurrent Error-Detection Systems

    Д.В. Ефанов, Valery Sapozhnikov, Vladimir Sapozhnikov +2

    Maqola201911 iqtibos
    ABI

  3. Code Design for Dependable Systems

    Eiji Fujiwara

    Kitob20059 iqtibos
    ABI

  4. Self‐checking Synchronous FSM Network Design with Low Overhead

    A. Matrosova, Ilya Levin, S. Ostanin

    Maqola19998 iqtibos
    ABI

  5. Error Detecting and Error Correcting Codes

    R. W. Hamming

    Maqola19507 iqtibos
    ABI

  6. Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs

    E.S. Sogomonyan, M. Goessel

    Maqola19937 iqtibos
    ABI

  7. Fault Detection Capabilities of Alternating Logic

    Reynolds, Metze

    Maqola19787 iqtibos
    ABI

  8. The Hybrid Structure of a Self-Dual Built-In Control Circuit for Combinational Devices with Pre-Compression of Signals and Checking of Calculations by Two Diagnostic Parameters

    Д.В. Ефанов, Д. В. Пивоваров

    Maqola20217 iqtibos
    ABI

  9. New Self‐dual Circuits for Error Detection and Testing

    А. Л. Дмитриев, V. Saposhnikov, V.V. Saposhnikov +3

    Maqola19997 iqtibos
    ABI

  10. Properties Investigation of Self-Dual Combinational Devices with Calculation Control Based on Hamming Codes

    Д.В. Ефанов, Tatiana S. Pogodina

    Maqola20237 iqtibos
    ABI

  11. Methods of Providing Hardware Safety for Microprocessor Train Control Systems

    P. F. Bestem’yanov

    Maqola20206 iqtibos
    ABI

  12. Experimental study on Hamming and Hsiao codes in the context of embedded applications

    Grigor Tshagharyan, G. Harutyunyan, S. Shoukourian +1

    Maqola20176 iqtibos
    ABI

  13. Design and Test Technology for Dependable Systems-on-Chip

    Ubar, Raimund, Raik, Jaan 1972-, Vierhaus, Heinrich Theodor

    Kitob20114 iqtibos
    ABI

  14. Logic Complement, a New Method of Checking the Combinational Circuits

    M. Gessel', Alexandre V. Morozov, Vladimir Sapozhnikov +1

    Maqola20034 iqtibos
    ABI

  15. Checking Combinational Circuits by the Method of Logic Complement

    M. Goessel, Alexandre V. Morozov, Vladimir Sapozhnikov +1

    Maqola20054 iqtibos
    ABI

  16. Experimental Results for Self-Dual Multi-Output Combinational Circuits

    V.V. Saposhnikov, Vl. Moshanin, V.V. Saposhnikov +1

    Maqola19994 iqtibos
    ABI

  17. A New Design Method for Self-Checking Unidirectional Combinational Circuits

    V.V. Saposhnikov, A. Morosov, V.V. Saposhnikov +1

    Maqola19984 iqtibos
    ABI

  18. Adaptive BIST for Concurrent On-Line Testing on Combinational Circuits

    Vasileios Chioktour, Athanasios Kakarountas

    Maqola20224 iqtibos
    ABI

  19. Sarlavhasiz

    Boshqa3 iqtibos
    ABI

  20. Self-Dual Digital Devices with Calculations Testing by Modified Hamming Code

    Д.В. Ефанов, Tatiana S. Pogodina

    Maqola20233 iqtibos
    ABI

  21. Cyber Physical Computing for IoT-driven Services

    Vladimir Hahanov

    Kitob20182 iqtibos
    ABI

  22. Application of Error Detection and Correction Techniques to Self-Checking VLSI Systems: An Overview

    A R Sahana, V Chiraag, Gautham Suresh +2

    Maqola20232 iqtibos
    ABI

  23. Sarlavhasiz

    Boshqa1 iqtibos
    ABI

  24. Sarlavhasiz

    Boshqa1 iqtibos
    ABI

  25. Sarlavhasiz

    Boshqa1 iqtibos
    ABI