Asosiy kontentga oʻtish
AkademIndex

Mahsulotlar

Ishlab chiquvchilar uchun

AkademBasetez oradaEkotizim uchun ochiq API
Lotin
Oʻzbek
Maqola

Electronic structure of Ga1–x Al x As nanostructures grown on the GaAs surface by ion implantation

S. B. DonaevTashkent State Technical University, ul. Universitetskaya 2, Tashkent, 100095, UzbekistanБ. Е. УмирзаковTashkent State Technical University, ul. Universitetskaya 2, Tashkent, 100095, UzbekistanД. А. ТашмухамедоваTashkent State Technical University, ul. Universitetskaya 2, Tashkent, 100095, Uzbekistan
Technical Physicsjournal2015en
ABI

Annotatsiya

The surface morphology and electronic properties of nanocrystalline phases and 2–7-nm-thick Ga1-x Al x As films grown on the GaAs(111) surface by Al+ ion implantation with subsequent (laser + thermal) annealing are studied. It is found that bandgap E g of the Ga0.5Al0.5As nanocrystalline surface phase 25–30 nm in size equals 2.8–2.9 eV.

Mavzular

Identifikatorlar

Iqtiboslar va manbalar

Koʻrsatkichlar — AkademScholar · Tez orada