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9 ta ish

Ish: High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 iqtibos
    ABI

  2. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 iqtibos
    ABI

  3. Indium sputtering upon bombardment with cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20122 iqtibos
    ABI

  4. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 iqtibos
    ABI

  5. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 iqtibos
    ABI

  6. Sputtering of GaAs target under Bi+ cluster ions bombardment

    Sh.Dj. Akhunov, G.P. Kakhramonova, Sh.M. Axmedov +2

    MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20221 iqtibos
    ABI

  7. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 iqtibos
    ABI

  8. SIMS of silicon bombarded with Sb+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 iqtibos
    ABI

  9. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

    Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

    MaqolaIon-surface interactions and analysisSurface and Interface Analysis20240 iqtibos
    ABI