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Works cited by this work

10 works

Work: Influence of the Gate Oxide and Back Oxide Material Types on Self-heating Effect in Junctionless FinFET

  1. Multigate transistors as the future of classical metal–oxide–semiconductor field-effect transistors

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  2. Short-channel effects in SOI MOSFETs

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  3. Self-heating effect in nanoscale SOI Junctionless FinFET with different geometries

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  4. Optimization of vertically stacked nanosheet FET immune to self-heating

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  5. Physical origin of negative differential resistance in SOI transistors

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  6. Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits

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  7. Self-Consistent Simulation of Heating Effects in Nanoscale Devices

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  8. Performance estimation of junctionless multigate transistors

    Chi‐Woo Lee, Isabelle Ferain, Aryan Afzalian +4

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  9. SOI versus bulk-silicon nanoscale FinFETs

    J.G. Fossum, Zhenming Zhou, L. Mathew +1

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  10. Untitled

    Other1 citations
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