Works citing this work

15 works

Work: Computer simulation of atomic-displacement cascades in solids in the binary-collision approximation

Computer Simulation of Scattering Xe+ Ions from InP(001)❬110❭ Surface at Grazing Incidence
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ArticleIon-surface interactions and analysise-Journal of Surface Science and Nanotechnology201911 citations
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Low Energy Ar+ Ion Scattering on InGaP(001) Surface
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ArticleIon-surface interactions and analysise-Journal of Surface Science and Nanotechnology20207 citations
ABI
Low-Energy Ne+ Ion Channeling and Implantation into Cu(100) and Cu3Au(100)
A. M. Rasulov, Abdurauf A. Dzhurakhalov
ArticleIon-surface interactions and analysisMRS Proceedings20034 citations
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Low energy ion scattering by atomic steps on the single crystal surface
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ABI
Chain effect for the inverse mass ratio of colliding particles in grazing ion–surface interactions
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ArticleIron oxide chemistry and applicationsSurface and Coatings Technology19983 citations
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Low-energy P+ ion channeling and implantation into Si(110), SiC(110), GaP(110) and GaAs(110)
A. M. Rasulov, A.A. Dzhurakhalov
ArticleIon-surface interactions and analysisComputational Materials Science20052 citations
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Determination of adatom sort and adsorption sites on single crystal surfaces by ions channeling through thin films
F. F. Umarov, A. M. Rasulov
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Study of ion scattering and dechanneling from surface defect structure by computer simulation
A.A. Dzhurakhalov, B.S. Kalandarov, Munis Kurbonov +2
ArticleIon-surface interactions and analysisComputational Materials Science20022 citations
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Inelastic energy losses of low-energy ions scattered on atoms in gas and on the solid surface
F. F. Umarov, N Narkulov, F.B Abdulkasymov
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The orientational effects in low-energy ions scattering from monocrystalline surfaces
R.A. Salimova, V.Kh. Ferleger
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Surface analysis of YBa2Cu3O7− high-Tc superconductor by low-energy small angle ion scattering
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ArticlePhysics of Superconductivity and MagnetismNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20000 citations
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Investigation of the dynamics of changes of the Cu3 Au(100) surface in the course of ordering by low energy ion scattering
A.A. Dzhurakhalov, F. F. Umarov
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Dynamic-sasamal: simulation software for high-dose ion implantation
Y. Miyagawa, H. Nakadate, Flyura Djurabekova +1
ArticleIon-surface interactions and analysisSurface and Coatings Technology20020 citations
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Investigation of sputtering and oxygen desorption processes by binary collision approximation method
A.A. Dzhurakhalov, S.E. Rahmatov, H. Dreyssé
ArticleIon-surface interactions and analysisComputational Materials Science20050 citations
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Effect of Ion Refocusing and Focusing at the Ne and Ar Small Angle Ion Bombardment on the Surface III-V Compound Semiconductors
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Works citing this work

Computer Simulation of Scattering Xe<sup>+</sup> Ions from InP(001)❬110❭ Surface at Grazing Incidence

Low Energy Ar<sup>+</sup> Ion Scattering on InGaP(001) Surface

Low-Energy Ne<sup>+</sup> Ion Channeling and Implantation into Cu(100) and Cu<sub>3</sub>Au(100)

Low energy ion scattering by atomic steps on the single crystal surface

Chain effect for the inverse mass ratio of colliding particles in grazing ion–surface interactions

Low-energy P+ ion channeling and implantation into Si(110), SiC(110), GaP(110) and GaAs(110)

Determination of adatom sort and adsorption sites on single crystal surfaces by ions channeling through thin films

Study of ion scattering and dechanneling from surface defect structure by computer simulation

Inelastic energy losses of low-energy ions scattered on atoms in gas and on the solid surface

The orientational effects in low-energy ions scattering from monocrystalline surfaces

Surface analysis of YBa2Cu3O7− high-Tc superconductor by low-energy small angle ion scattering

Investigation of the dynamics of changes of the Cu3 Au(100) surface in the course of ordering by low energy ion scattering

Dynamic-sasamal: simulation software for high-dose ion implantation

Investigation of sputtering and oxygen desorption processes by binary collision approximation method

Effect of Ion Refocusing and Focusing at the Ne and Ar Small Angle Ion Bombardment on the Surface III-V Compound Semiconductors