Работы, цитирующие эту работу

Работ: 5

Работа: Study of the Influence of Implanted Atoms on the Coefficients of the Sputtering of Silicon and Silicon with a Thin Oxide Film

1. Study of the Composition of Uncontrolled Impurities and the Profiles of Their Distribution at the Ni–CdS Interface

   A. A. Abduvayitov, Kh. Kh. Boltaev, G. A. Rozikov

   СтатьяChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2022Цитирований: 0

   ABIABI:AkademIndex/openalex/2022.article.008003

2. Peculiarities of Photoelectron Spectra of Ge Implanted with Na-=SUP=-+-=/SUP=- Ions

   S. T. Abraeva, Д. А. Ташмухамедова, M. B. Yusupjanova +1

   СтатьяIon-surface interactions and analysisПисьма в журнал технической физики2023Цитирований: 0

   ABIABI:AkademIndex/openalex/2023.article.006069

3. Impact of bombardment by Ar⁺, Na⁺ and <i>O</i>₂⁺ ions on spectra of elastically scattered electrons of single-crystal Ge

   S. T. Abraeva, Д. А. Ташмухамедова, Soadat Gulyamova +2

   СтатьяSilicon Nanostructures and PhotoluminescenceE3S Web of Conferences2023Цитирований: 0

   ABIABI:AkademIndex/openalex/2023.article.009656

4. Epitaxial Growth of Ge Nanofilms on the Surface of SrF2

   S. T. Abraeva, Д. А. Ташмухамедова, Б. Е. Умирзаков

   СтатьяSemiconductor materials and devicesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2023Цитирований: 0

   ABIABI:AkademIndex/openalex/2023.article.013288

5. Effect of Electron Bombardment on the Composition and Structure of CaF2/Si(111) Films

   A. A. Abduvayitov, Д. А. Ташмухамедова, Б. Е. Умирзаков +1

   СтатьяSemiconductor materials and devicesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.article.003446