Работы, цитирующие эту работу

Работ: 6

Работа: Angular Distributions of Scattered Ne and Ar Ions at the Grazing Incidence on the InGaP (001) 110 Surface

1. Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

   U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

   СтатьяIon-surface interactions and analysisSilicon2021Цитирований: 11

   ABIABI:AkademIndex/openalex/2026.other.144468

2. Formation of defects on the surface of LiF crystals under irradiation with different ions mass

   Utkirjon Sharopov, Umid Gopparov, K. Yu. Rashidov +8

   СтатьяIon-surface interactions and analysisRadiation effects and defects in solids2022Цитирований: 9

   ABIABI:AkademIndex/openalex/2026.other.144479

3. Investigation of Defect InP(001) Surface by Low Energy Ion Scаttering Spectroscopy

   М. K. Kаrimov, F.O. Kuryozov, Sh.R. Sadullaev +2

   СтатьяIntegrated Circuits and Semiconductor Failure AnalysisMaterials science forum2022Цитирований: 8

   ABIABI:AkademIndex/openalex/2026.other.273069

4. Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films

   Utkirjon Sharopov, Kulwinder Kaur, М. К. Курбанов +5

   СтатьяIon-surface interactions and analysisSurface and Interface Analysis2022Цитирований: 6

   ABIABI:AkademIndex/openalex/2026.other.144470

5. Analysis of InGaP(001) surface by the low energy ion scattering spectroscopy

   Uchkun Kutliev, М. K. Kаrimov, F.O. Kuryozov +1

   СтатьяIon-surface interactions and analysisJournal of Physics Conference Series2021Цитирований: 4

   ABIABI:AkademIndex/openalex/2026.other.290701

6. Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

   U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

   ПрепринтSemiconductor materials and devicesResearch Square2021Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.365538