Работы, на которые ссылается эта работа

Работ: 43

Работа: Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions
Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев
СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2003Цитирований: 13
ABI
Thermal spikes observed during the tantalum sputtering by gold cluster ions
С. Н. Морозов, У. Х. Расулев
СтатьяIon-surface interactions and analysisTechnical Physics Letters2003Цитирований: 12
ABI
Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles
С. Н. Морозов, У. Х. Расулев
СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2006Цитирований: 11
ABI
The formation of clusters during ion induced sputtering of metals
A. Wucher, Michael Wahl
Статья1996Цитирований: 11
ABI
Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment
С. Н. Морозов, У. Х. Расулев
СтатьяIon-surface interactions and analysisApplied Surface Science2004Цитирований: 11
ABI
High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment
S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2
СтатьяIon-surface interactions and analysisVacuum2000Цитирований: 9
ABI
Nonlinear effects in cluster emission from solids induced by molecular ion impact
S.F. Belykh, I.S. Bitensky, D. Mullajanov +1
Статья1997Цитирований: 9
ABI
Shock wave mechanism for cluster emission and organic molecule desorption under heavy ion bombardment
I.S. Bitensky, E.S. Parilis
Статья1987Цитирований: 8
ABI
Sputtering from elastic-collision spikes in heavy-ion-bombarded metals
Peter Sigmund, Claus D. Claussen
Статья1981Цитирований: 8
ABI
Cluster impacts at keV and MeV energies: Secondary emission phenomena
Y. Le Beyec
Статья1998Цитирований: 7
ABI
Very large gold and silver sputtering yields induced by keV to MeV energy<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Au</mml:mi></mml:mrow><mml:mrow><mml:mi>n</mml:mi></mml:mrow></mml:msub></mml:mrow></mml:math>clusters<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mo>(</mml:mo><mml:mi>n</mml:mi><mml:mo>=</mml:mo><mml:mn>1</mml:mn><mml:mn/><mml:mo>–</mml:mo><mml:mn>1</mml:mn><mml:mn>3</mml:mn><mml:mo>)</mml:mo></mml:math>
S. Bouneau, Alain Brunelle, S. Della‐Negra +7
Статья2002Цитирований: 7
ABI
Sputtering source of cluster ions and surface-ionization source of polyatomic ions of organic compounds
У. Х. Расулев, С. Н. Морозов, У. Хасанов +1
СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2006Цитирований: 5
ABI
The Magic of Cluster SIMS
Nicholas Winograd
Статья2005Цитирований: 5
ABI
Model for the emission of quasi-thermal atoms during sputtering of metals in the nonlinear collision cascade regime
S.F. Belykh, А. Б. Толстогузов, A. A. Lozovan +2
Статья2014Цитирований: 3
ABI
Molecular secondary ion formation under cluster bombardment: A fundamental review
A. Wucher
Обзорная статья2006Цитирований: 3
ABI
On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions
Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov
СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2021Цитирований: 3
ABI
Sputtered cluster mass distributions, thermodynamic equilibrium and critical phenomena
Herbert M. Urbassek
Статья1988Цитирований: 3
ABI
Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions
Robyn E. Goacher, Hong Luo, Joseph A. Gardella
Статья2008Цитирований: 2
ABI
Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement
Andreas Heile, D. Lipinsky, Nimer Wehbe +8
Статья2008Цитирований: 2
ABI
Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials
M. P. Seah
Статья2007Цитирований: 2
ABI
Recent Progress in Cluster Beam Technique
Jiro Matsuo, Makiko Fujii, Toshio Seki +1
Статья2016Цитирований: 2
ABI
Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization
Hua Tian, A. Wucher, Nicholas Winograd
Статья2016Цитирований: 2
ABI
Nonlinear effects in low-energy ion sputtering of solids
Yuriy Kudriavtsev, R. Asomoza, A. G. Hernández +3
Статья2020Цитирований: 2
ABI
Sputtering of silicon by atomic and cluster bismuth ions: An influence of projectile nuclearity and specific kinetic energy on the sputter yield
A. Tolstogouzov, Paul Mazarov, A.E. Ieshkin +4
Статья2021Цитирований: 2
ABI
Energy spectra of ions and the energy dependence of the degree of ionization of atoms emitted from metals in a nonlinear sputtering mode
S.F. Belykh, А. Б. Толстогузов, A. A. Lozovan
Статья2015Цитирований: 2
ABI