Работы, цитирующие эту работу

Работ: 3

Работа: Silicide thin films and their applications in microelectronics

1. Investigation of optical and electrophysical properties of Mn4Si7 coatings of different thickness

   Б.Д. Игамов, I. R. Bekpulatov, Gunel Imanova +2

   СтатьяSemiconductor materials and interfacesPhysics and Chemistry of Solid State2024Цитирований: 5

   ABIABI:AkademIndex/openalex/2026.other.267083

2. About the mechanism of formation and growth of the higher manganese silicide films on silicon

   T. S. Kamilov, D.K. Kabilov, I.S. Samiev +6

   СтатьяSemiconductor materials and interfaces2005Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.424565

3. Growth technique and structural properties of the higher manganese silicide films

   T. S. Kamilov, D.K. Kabilov, I.S. Samiev +3

   СтатьяSemiconductor materials and interfaces2005Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.609626