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Работы, цитирующие эту работу

Работ: 8

Работа: Modification of the Surface Properties of Free Si–Cu Films by Implantation of Active Metal Ions

  1. Comparison of electron irradiation on the formation of surface defects in situ and post thin-film LiF/Si(111) deposition

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +4

    СтатьяSemiconductor materials and devicesThin Solid Films2021Цитирований: 13
    ABI

  2. Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    СтатьяIon-surface interactions and analysisSilicon2021Цитирований: 11
    ABI

  3. Electrophysical and thermoelectric properties and crystal structure of the formed Mn4Si7 thin vacuum coatings

    Б.Д. Игамов, Gunel Imanova, Vera Loboda +3

    СтатьяChalcogenide Semiconductor Thin FilmsOptical Materials X2024Цитирований: 4
    ABI

  4. Electronic Structure and Properties of Nanoscale Structures Created on the Surface of a Free Si/Cu Film System

    З. А. Исаханов, R. M. Yorkulov, Б. Е. Умирзаков +2

    СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2021Цитирований: 2
    ABI

  5. Distribution of Molybdenum Atoms over Depth of the Surface Layer of a Niobium Single Crystal Produced by Ion Bombardment

    Y. S. Ergashov, S. B. Donaev

    СтатьяIon-surface interactions and analysisJournal of Nano- and Electronic Physics2022Цитирований: 1
    ABI

  6. Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    ПрепринтSemiconductor materials and devicesResearch Square2021Цитирований: 1
    ABI

  7. CHANGES IN THE SURFACE OF CdS BOMBARDED BY O+ IONS

    Sodikjanov Jakhongirbek Shukhratbek Ugli

    СтатьяQuantum Dots Synthesis And PropertiesThe American Journal of Engineering And Technology2023Цитирований: 0
    ABI

  8. Temperature dependence changes in the physical and chemical properties of ZnO detected by powder diffractometry

    U.Kh. Kholikov, Ш. Т. Хожиев, И.О. Косимов +7

    СтатьяZnO doping and propertiesOptics Communications2025Цитирований: 0
    ABI