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Работы, на которые ссылается эта работа

Работ: 15

Работа: Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2003Цитирований: 13
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisTechnical Physics Letters2003Цитирований: 12
    ABI

  3. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisApplied Surface Science2004Цитирований: 11
    ABI

  4. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

    СтатьяIon-surface interactions and analysisVacuum2000Цитирований: 9
    ABI

  5. Nonlinear effects in cluster emission from solids induced by molecular ion impact

    S.F. Belykh, I.S. Bitensky, D. Mullajanov +1

    Статья1997Цитирований: 9
    ABI

  6. Cluster impacts at keV and MeV energies: Secondary emission phenomena

    Y. Le Beyec

    Статья1998Цитирований: 7
    ABI

  7. Very large gold and silver sputtering yields induced by keV to MeV energy<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Au</mml:mi></mml:mrow><mml:mrow><mml:mi>n</mml:mi></mml:mrow></mml:msub></mml:mrow></mml:math>clusters<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mo>(</mml:mo><mml:mi>n</mml:mi><mml:mo>=</mml:mo><mml:mn>1</mml:mn><mml:mn/><mml:mo>–</mml:mo><mml:mn>1</mml:mn><mml:mn>3</mml:mn><mml:mo>)</mml:mo></mml:math>

    S. Bouneau, Alain Brunelle, S. Della‐Negra +7

    Статья2002Цитирований: 7
    ABI

  8. Non-linear effects in Ta sputtering by Au− ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2003Цитирований: 6
    ABI

  9. Relative yields, mass distributions and energy spectra of cluster ions sputtered from niobium under keV atomic and polyatomic gold ion bombardment

    S.F. Belykh, B Habets, У. Х. Расулев +3

    СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2000Цитирований: 5
    ABI

  10. ToF-SIMS : surface analysis by mass spectrometry

    John C. Vickerman, D. Briggs

    Книга2001Цитирований: 5
    ABI

  11. Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

    D. Stapel, O. Brox, A. Benninghoven

    Статья1999Цитирований: 5
    ABI

  12. Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

    Alain Brunelle, S. Della‐Negra, J. Depauw +5

    Статья2001Цитирований: 5
    ABI

  13. Nonadditive sputtering of silicon by keV energy molecular projectiles of heavy and light elements

    S.F. Belykh, A.P. Kovarsky, Vladimir Palitsin +2

    Статья2001Цитирований: 3
    ABI

  14. A C<sub>60</sub> Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

    Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer +3

    Статья2003Цитирований: 3
    ABI

  15. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

    Greg Gillen, Sonya Roberson

    Статья1998Цитирований: 2
    ABI