Работы, цитирующие эту работу

Работ: 2

Работа: Semiconductor Surface Physics

1. Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET

   A. É. Atamuratov, M. M. Khalilloev, Ahmed Yusupov +3

   СтатьяSemiconductor materials and devicesApplied Sciences2020Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.541488

2. Flicker noise and electron–phonon interaction in metallic point contacts

   A. M. Zagoskin, I. O. Kulik, A. N. Omel’yanchuk

   СтатьяForce Microscopy Techniques and ApplicationsSoviet Journal of Low Temperature Physics1987Цитирований: 0

   ABIABI:AkademIndex/openalex/1987.article.000179