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Force Microscopy Techniques and Applications

Работ: 128

  1. Procedure for determining defects in sputtered clusters of ionic crystals

    Utkirjon Sharopov, Б.Г. Атабаев, R. Djabbarganov +2

    СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2016Цитирований: 14
    ABI

  2. On the tensosensitivity of a p-n junction under illumination

    G. Gulyamov, A. G. Gulyamov

    СтатьяOptical Polarization and EllipsometrySemiconductors2015Цитирований: 10
    ABI

  3. Structural and some electrophysical properties of the solid solutions Si1 − x Sn x (0 ≤ x ≤ 0.04)

    А. С. Саидов, Sh. N. Usmonov, M. U. Kalanov +2

    СтатьяAdvanced Surface Polishing TechniquesPhysics of the Solid State2013Цитирований: 8
    ABI

  4. Surface tamm states at curved surfaces of ionic crystals

    Б. Л. Оксенгендлер, N. N. Turaeva

    СтатьяForce Microscopy Techniques and ApplicationsDoklady Physics2010Цитирований: 8
    ABI

  5. Modification of Phospholipid Membrane Structure by the Plant Toxic Peptide Pyrularia Thionin

    Sardar E. Gasanov, Leo P. Vernon, T. F. Aripov

    СтатьяLipid Membrane Structure and BehaviorArchives of Biochemistry and Biophysics1993Цитирований: 6
    ABI

  6. Magnetic Properties of Silicon Doped with Impurity Atoms of Europium

    Н. Ф. Зикриллаев, G. H. Mavlonov, Levent Trabzon +4

    СтатьяMagnetic properties of thin filmsJournal of Nano- and Electronic Physics2023Цитирований: 5
    ABI

  7. Time delay in electron-C <sub>60</sub> elastic scattering in a dirac bubble potential model

    M. Ya. Amusia, A S Baltenkov

    СтатьяFullerene Chemistry and ApplicationsJournal of Physics B Atomic Molecular and Optical Physics2018Цитирований: 4
    ABI

  8. Electrophysical properties of the “nano-object-semiconductor” new contact structure

    E. Z. Imamov, T. A. Dzhalalov, Р. А. Муминов

    СтатьяForce Microscopy Techniques and ApplicationsTechnical Physics2015Цитирований: 3
    ABI

  9. Digital holographic interferometry in physical nanomeasurements

    Z. T. Azamatov, N. A. Akbarova, I. A. Kulagin +3

    СтатьяDigital Holography and MicroscopyNanosystems Physics Chemistry Mathematics2017Цитирований: 3
    ABI

  10. Dynamics of stratified-convected Eyring-Powell nanoliquid featuring chemically reactive species and Ohmic dissipation: Application of Levenberg-Marquardt artificial neural networks(ALM-ANNs)

    Zahoor Shah, M. Waqas, Muhammad Asif Zahoor Raja +4

    СтатьяNanofluid Flow and Heat TransferInternational Journal of Heat and Fluid Flow2024Цитирований: 3
    ABI

  11. Calibration of machine platform nonlinearity in Instrumented Indentation Test in the macro range

    Jasurkhuja Kholkhujaev, Giacomo Maculotti, Gianfranco Genta +1

    СтатьяMetal and Thin Film MechanicsPrecision Engineering2023Цитирований: 3
    ABI

  12. Controlling the Friction Coefficient and Adhesive Properties of a Contact by Varying the Indenter Geometry

    I. A. Lyashenko, Thao H. Pham, Valentin L. Popov

    СтатьяAdhesion, Friction, and Surface InteractionsProcesses2024Цитирований: 2
    ABI

  13. Ionic liquids as green and smart lubricant application: an overview

    Dakeshwar Kumar Verma, Yeestdev Dewangan, Ajaya Kumar Singh +6

    СтатьяLubricants and Their AdditivesIonics2022Цитирований: 2
    ABI

  14. Discrete sine-Gordon equation on metric graphs: A simple model for Josephson junction networks

    M. Akramov, Jambul Yusupov, I. N. Askerzade +1

    СтатьяNonlinear Photonic SystemsPhysica Scripta2023Цитирований: 2
    ABI

  15. Formation of higher manganese silicide films on silicon

    T. S. Kamilov, D.K. Kabilov, I.S. Samiev +3

    СтатьяSemiconductor materials and interfacesTechnical Physics2005Цитирований: 2
    ABI

  16. Tensoresistive effects in tin-doped silicon under static and dynamic pressure conditions

    О. О. Маматкаримов, Р. Х. Хамидов

    СтатьяForce Microscopy Techniques and ApplicationsTechnical Physics Letters2003Цитирований: 1
    ABI

  17. Ad Hoc Modeling of Rate-Dependent Adhesion in Indentation Relaxation Testing

    Ivan Argatov, I. A. Lyashenko, Valentin L. Popov

    СтатьяAdhesion, Friction, and Surface InteractionsMaterials2024Цитирований: 1
    ABI

  18. Propagation of elastic waves in adhesive contacts: experiment and numerical model

    I. A. Lyashenko, А. Е. Филиппов, Valentin L. Popov

    СтатьяAdhesion, Friction, and Surface InteractionsFrontiers in Mechanical Engineering2024Цитирований: 1
    ABI

  19. Improvement of instrumented indentation test accuracy by data augmentation with electrical contact resistance

    Maurizio Galetto, Jasurkhuja Kholkhujaev, Giacomo Maculotti

    СтатьяMetal and Thin Film MechanicsCIRP Annals2023Цитирований: 1
    ABI

  20. Control of the excitation conditions and the parameters of self-sustained oscillations of current in compensated silicon doped with manganese

    М. К. Бахадырханов, Kh. Azimkhuzhaev, Н. Ф. Зикриллаев +2

    СтатьяSilicon and Solar Cell TechnologiesSemiconductors2000Цитирований: 1
    ABI

  21. &lt;title&gt;Chemical vapor deposition of diamond films on nonuniformly heated substrates&lt;/title&gt;

    М. Х. Ашуров, М. С. Саидов, Timur Saliev

    СтатьяDiamond and Carbon-based Materials ResearchProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE1998Цитирований: 1
    ABI

  22. Thermal Investigations of nBABAs

    K. Usha Deniz, E. B. Mirza, P. S. Parvathanathan +2

    СтатьяForce Microscopy Techniques and ApplicationsMolecular crystals and liquid crystals1984Цитирований: 1
    ABI

  23. ac Josephson current as a function of voltage

    A. I. Akimenko, В. С. Соловьев, I. K. Yanson

    СтатьяForce Microscopy Techniques and ApplicationsSoviet Journal of Low Temperature Physics1976Цитирований: 0
    ABI

  24. Effects of electron-phonon interaction on conductance oscillations in a metal with linear chains of magnetically coupled orbits

    V. L. Ginzburg

    СтатьяCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics1976Цитирований: 0
    ABI

  25. Electrical conductivity of point microbridges and phonon and impurity spectroscopy in normal metals

    I. O. Kulik, A. N. Omel’yanchuk, R. I. Shekhter

    СтатьяSurface and Thin Film PhenomenaSoviet Journal of Low Temperature Physics1977Цитирований: 0
    ABI