Photoelectric properties of higher manganese silicide (HMS)-SilangleMnrangle-M structures
T. S. KamilovTashkent State Institute of Aviation, 12 Akhunbabaev st., Tashkent 700047, UzbekistanV. P. ChirvaInstitute of Electronics, Academy of Sciences of the Republic of Uzbekistan, 33 F Hodzhaev st., Tashkent 700143, UzbekistanD.K. KabilovInstitute of Electronics, Academy of Sciences of the Republic of Uzbekistan, 33 F Hodzhaev st., Tashkent 700143, Uzbekistan
ABI
Аннотация
Photoelectric properties of (HMS)-SiMn-M structures, where HMS is higher manganese silicide formed in diffusion doping of silicon with manganese and M is metal contact, have been studied in a wide range of temperatures and light wavelengths.
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