Semiconductor Science and Technology

4 та иш

Журнал · ISSN 0268-1242

1. Photoelectric properties of higher manganese silicide (HMS)-SilangleMnrangle-M structures

   T. S. Kamilov, V. P. Chirva, D.K. Kabilov

   МақолаSemiconductor materials and interfacesSemiconductor Science and Technology199911 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.199244

2. Wave processes in silicon samples with nickel impurities arising at pulsed hydrostatic pressure

   Р. Х. Хамидов, О. О. Маматкаримов

   МақолаElectromagnetic Effects on MaterialsSemiconductor Science and Technology20213 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.250850

3. Superlinearity of photocurrent in polycrystalline Si p - n structures

   B. M. Abdurakhmanov, Р. Алиев, R. Bilyalov

   МақолаSilicon Nanostructures and PhotoluminescenceSemiconductor Science and Technology19961 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.624474

4. Formation of radiation defects in silicon structures under low-intensity electron irradiation

   Sh. Makhkamov, N.A. Tursunov, M. Ashurov +2

   МақолаSemiconductor materials and interfacesSemiconductor Science and Technology20010 иқтибос

   ABIABI:AkademIndex/openalex/2001.article.000146