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Иш: Formation of defects in GaAs and Si as a result of Pd deposition onto the surface
Effect of the Angle of Incidence of Low-Energy Ar+ Ion Beams on the Composition and Structure of the GaAs Surface
Д. А. Ташмухамедова, Б. Е. Умирзаков, Z. A. Tursunmetova
МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20240 иқтибосABI