A. S. Risbaev

2 ta ish

Islom Karimov nomidagi Toshkent davlat texnika universiteti

1. Method for additional purification of the surface of Si(111) single crystal

   A. S. Risbaev, J. B. Khujaniyazov, I. R. Bekpulatov +1

   MaqolaMaterial Properties and Failure MechanismsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques201713 iqtibos

   ABIABI:AkademIndex/2017.article.000098

2. Structure of МеSi Silicide Films (Me: Li, Rb, K and Cs) According to Electron Microscopy Data and the Diffraction of Slow Electrons

   M.T. Normuradov, A. S. Risbaev, J. B. Khujaniyozov +1

   MaqolaSemiconductor materials and interfacesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20202 iqtibos

   ABIABI:AkademIndex/2026.other.213643