M.T. Normuradov
14 ta ish
Qarshi Davlat Universiteti
Theoretical Explanation of the Effect of a Decrease in the Si(111) Plasmon Energy during the Implantation of Ions with a Large Dose
А.С. Рысбаев, J. B. Khujaniyozov, M.T. Normuradov +3
MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20203 iqtibosABIStructure of МеSi Silicide Films (Me: Li, Rb, K and Cs) According to Electron Microscopy Data and the Diffraction of Slow Electrons
M.T. Normuradov, A. S. Risbaev, J. B. Khujaniyozov +1
MaqolaSemiconductor materials and interfacesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20202 iqtibosABIFormation of CrSi2 film and measurement of optical band gap energy
K.T. Dovranov, Gunel Imanova, Vera Loboda +2
MaqolaOchiq kirish20240 iqtibosABIResistive Switching Behavior of Si/TiO Thin Films for Non-Volatile Memory Applications
M.T. Normuradov, O Ochilov, Ozodbek Y. Yuldashev +2
MaqolaOchiq kirish20260 iqtibosABI