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16 ta ish

Ish: Structure Determination and Defect Analysis n-Si<Lu>, p-Si<Lu> Raman Spectrometer Methods

  1. Multiphonon Raman Spectrum of Silicon

    P. A. Temple, C. E. Hathaway

    Maqola19738 iqtibos
    ABI
  2. Raman spectroscopic study of microcrystalline silica

    Kathleen J. Kingma, Russell J. Hemley

    Maqola19946 iqtibos
    ABI
  3. 15

    Gertrudis Gómez de Avellaneda

    Bob20226 iqtibos
    ABI
  4. The structural aspects of non-crystalline SiO2 films on silicon: a review

    A. G. Revesz, H.L. Hughes

    Sharh maqola20032 iqtibos
    ABI