← Ishga qaytish
Ushbu ish iqtibos qilgan ishlar
16 ta ish
Ish: Structure Determination and Defect Analysis n-Si<Lu>, p-Si<Lu> Raman Spectrometer Methods
Raman spectroscopic study of microcrystalline silica
Kathleen J. Kingma, Russell J. Hemley
Maqola19946 iqtibosABIThe structural aspects of non-crystalline SiO2 films on silicon: a review
Sharh maqola20032 iqtibosABI