Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: AC versus DC hot-carrier degradation in n-channel MOSFETs

1. Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection

   A. É. Atamuratov, Ahmed Yusupov, Zamira Atamuratova +2

   MaqolaSemiconductor materials and devicesApplied Sciences20203 iqtibos

   ABIABI:AkademIndex/openalex/2020.article.000900

2. Capacitance-Voltage Method for Detecting the local oxide trapped charge in SOI FinFET

   A.E. Abdikarimov, Mirzabahrom Foziljonov, И. Н. Каримов

   MaqolaSemiconductor materials and devices20220 iqtibos

   ABIABI:AkademIndex/openalex/2022.article.011220