Ushbu ishga iqtibos qilgan ishlar

3 ta ish

Ish: Anomalous Behavior of Lateral C–V Characteristic of an MNOS Transistor with an Embedded Local Charge in the Nitride Layer

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2. The Influence of a Single Charged Interface Trap on the Subthreshold Drain Current in FinFETs with Different Fin Shapes

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3. Capacitance Method for Identifying Degradation due to Electrical Stress in MOSFETs

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