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6H(n<sup>+</sup>)/3C(n)/6H(p<sup>+</sup>) - SiC Structures Grown by Sublimation Epitaxy

Anatoly M. Strel’chukA.F. Ioffe Physicotechnical Institute RASA. А. LebedevRussian Academy of SciencesA. E. CherenkovIoffe Physicotechnical Institute RASAlexey N. KuznetsovRussian Academy of SciencesA. S. TregubovaRussian Academy of SciencesM. P. ScheglovRussian Academy of SciencesL. M. SorokinRussian Academy of SciencesS. YonedaKyoto Institute of TechnologyShigehiro NishinoDong-Eui University
ABI

Аннотация

Investigation of the multilayer 6H(n+)/3C(n)/6H(p+)-SiC heterostructure grown by sublimation epitaxy show that the injection electroluminescence (IEL) in the green region (hνmax≈2.30-2.35eV) of spectrum is dominant. This band is close to the electroluminescence peak due to defects in 6H-SiC but also can be due to free exciton annihilation in a quantum well in 3C-SiC at the 6H/3C-SiC heterointerface. At high current the IEL peak at hνmax≈2.9 eV is found. This peak (and also two another peaks in blue part of spectra: hνmax≈2.6 eV and hνmax≈2.72 eV) can be attributed to recombination in 6H-SiC. The forward current-voltage characteristics for best structures are close to those for ideal 6H-SiC pn homostructure and characterized by abrupt breakdown. A lot of structures are characterized by barrier type excess current. Structure in the region of evident 3C-SiC inclusion is characterized by high forward and reverse excess currents.

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