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Работы, цитирующие эту работу

Работ: 11

Работа: Computer Simulation of Scattering Xe<sup>+</sup> Ions from InP(001)❬110❭ Surface at Grazing Incidence

  1. Comparison of electron irradiation on the formation of surface defects in situ and post thin-film LiF/Si(111) deposition

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +4

    СтатьяSemiconductor materials and devicesThin Solid Films2021Цитирований: 13
    ABI

  2. Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    СтатьяIon-surface interactions and analysisSilicon2021Цитирований: 11
    ABI

  3. Formation of defects on the surface of LiF crystals under irradiation with different ions mass

    Utkirjon Sharopov, Umid Gopparov, K. Yu. Rashidov +8

    СтатьяIon-surface interactions and analysisRadiation effects and defects in solids2022Цитирований: 9
    ABI

  4. Angular Distributions of Scattered Ne and Ar Ions at the Grazing Incidence on the InGaP (001) 110 Surface

    М. K. Kаrimov, Uchkun Kutliev, Kamola Otabaeva +1

    СтатьяRadiation Detection and Scintillator TechnologiesJournal of Nano- and Electronic Physics2020Цитирований: 6
    ABI

  5. Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films

    Utkirjon Sharopov, Kulwinder Kaur, М. К. Курбанов +5

    СтатьяIon-surface interactions and analysisSurface and Interface Analysis2022Цитирований: 6
    ABI

  6. Analysis of InGaP(001) surface by the low energy ion scattering spectroscopy

    Uchkun Kutliev, М. K. Kаrimov, F.O. Kuryozov +1

    СтатьяIon-surface interactions and analysisJournal of Physics Conference Series2021Цитирований: 4
    ABI

  7. Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    ПрепринтSemiconductor materials and devicesResearch Square2021Цитирований: 1
    ABI

  8. Inelastic energy loss of Ar ions scattered Al2O3 surface under grazing incidence

    Atabek S. Ashirov, Muzaffar Qurbanov, I.U. Tangribergenov +2

    СтатьяIon-surface interactions and analysisPhysics and Chemistry of Solid State2021Цитирований: 1
    ABI

  9. Computer Simulation of Adsorption of Fullerene on Graphene

    Abror Ulukmuradov, I.D. Yadgarov, V. G. Stel’makh +1

    СтатьяFullerene Chemistry and ApplicationsJournal of Nano- and Electronic Physics2021Цитирований: 0
    ABI

  10. Doping of Silicon with Gadolinium Atoms – Structural Distribution and Raman Spectral Changes

    Sharifa B. Utamuradova, Shakhrukh Kh. Daliev, Jonibek J. Khamdamov +3

    СтатьяIon-surface interactions and analysisEast European Journal of Physics2025Цитирований: 0
    ABI

  11. Study of the Formation of Low-Dimensional Defect States in Single-Crystal Silicon with the Participation of Oxygen

    Akramjon Y. Boboev, Biloliddin M. Ergashev, Nuritdin Y. Yunusaliyev +1

    СтатьяSilicon and Solar Cell TechnologiesEast European Journal of Physics2025Цитирований: 0
    ABI