Работы, цитирующие эту работу

Работ: 2

Работа: Structural Quality of Directly Bonded Silicon Wafers with Regularly Grooved Interfaces

1. Regular relief on a silicon surface as a structural defect getter

   L. S. Berman, I. V. Grekhov, L. S. Kostina +3

   СтатьяSilicon and Solar Cell TechnologiesTechnical Physics Letters1999Цитирований: 0

   ABIABI:AkademIndex/openalex/1999.article.000131

2. Current-voltage characteristics of Si/Si1 − x Ge x heterodiodes fabricated by direct bonding

   I. V. Grekhov, E. I. Belyakova, L. S. Kostina +7

   СтатьяSemiconductor materials and interfacesTechnical Physics Letters2008Цитирований: 0

   ABIABI:AkademIndex/openalex/2008.article.000211