Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: Formation of higher manganese silicide films on silicon

1. The Influence of Structural Defects in Silicon on the Formation of Photosensitive Mn4Si7–Si❬Mn❭–Mn4Si7 and Mn4Si7–Si❬Mn❭–M Heterostructures

   T. S. Kamilov, А.С. Рысбаев, V. V. Klechkovskaya +3

   МақолаSemiconductor materials and interfacesApplied Solar Energy201921 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.079743

2. Electron microscopy characterization of higher manganese silicide film structure on silicon

   Andrey Orekhov, T. S. Kamilov, Anton S. Orekhov +3

   МақолаSemiconductor materials and interfacesNanotechnologies in Russia20167 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.079735