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Ish: Raman Spectoroscopy of Silicon Single Crystals, Doped with Palladium and Irradiated by GammaRays
Raman spectroscopy of PtSi formation at the Pt/Si(100) interface
J. C. Tsang, Y. Yokota, R. Matz +1
Maqola19846 iqtibosABIInfluence of Different Types of Radiation on the Crystal Structure of Silicon Monocrystals n-Si
Sharifa B. Utamuradova, Dilmurod A. Rakhmanov, A.S. Abiyev
MaqolaOchiq kirish20246 iqtibosABIIron contamination in silicon technology
A. A. Istratov, H. Hieslmair, E. R. Weber
Maqola20006 iqtibosABIOne and two-phonon Raman scattering from nanostructured silicon
Igor Iatsunskyi, Grzegorz Nowaczyk, Stefan Jurga +3
MaqolaOchiq kirish20155 iqtibosABIDetermining the material structure of microcrystalline silicon from Raman spectra
C. Smit, R.A.C.M.M. van Swaaij, H. Donker +3
MaqolaOchiq kirish20035 iqtibosABIINFLUENCE OF ALPHA PARTICLES ON TECHNOLOGICAL IMPURITIES IN SILICON DOPED WITH PLATINUM
MaqolaOchiq kirish20255 iqtibosABIResonant Raman scattering of a single layer of Si nanocrystals on a silicon substrate
A. Wellner, Vincent Paillard, H. Coffin +2
MaqolaOchiq kirish20043 iqtibosABIRadiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors
C. Altana, L. Calcagno, C. Ciampi +8
Maqola20232 iqtibosABI