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Ish: Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET
Quantum corrections in the simulation of decanano MOSFETs
Asen Asenov, A. R. Brown, J.R. Watling
Maqola20034 iqtibosABILarge random telegraph noise in sub-threshold operation of nano-scale nMOSFETs
J. P. Campbell, Lihua Yu, Kin P. Cheung +4
Maqola20093 iqtibosABIPerformance estimation of junctionless multigate transistors
Chi‐Woo Lee, Isabelle Ferain, Aryan Afzalian +4
Maqola20093 iqtibosABIRTN distribution comparison for bulk, FDSOI and FinFETs devices
Louis Gerrer, Salvatore Amoroso, Razaidi Hussin +1
Maqola20143 iqtibosABI